Advanced atomic force microscopies and their applications in two-dimensional materials: a review

Abstract Scanning probe microscopy (SPM) allows the spatial imaging, measurement, and manipulation of nano atomic scale surfaces in real space. In last two decades, numerous advanced functional SPM methods, particularly force (AFM), have been developed applied various research fields, from mapping sample morphology to measuring physical properties. Herein, we review recent progress AFM methods their applications studies two-dimensional (2D) materials, interfacial properties on substrates. This can inspire more exciting application works using modes 2D materials fields.